
Quantitative X-Ray Spectrometry
Jenkins, Ron (International Centre for Diffraction Data, Newtown Square, Pennsylvania, Usa)
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- First indexed
- 20 Sep 2026
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Description
Covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This title explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features fresh applications in environmental studies, forensic science, minerals and ore, and ceramic materials.
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.